Transient X-ray Spectroscopy & Diffraction
Max Planck Research Group Michael Zürch
Transient X-ray Spectroscopy & Diffraction
Max Planck Research Group Michael Zürch

News Post
Perspective on single shot time-resolved microscopy using short wavelength table-top light sources published
Feb 13 2019

Our perspective “Towards single shot time-resolved microscopy using short wavelength table-top light sources” has been published in Structural Dynamics and was selected as featured publication. In this perspective, we present the current state of the art techniques for full-field imaging in the extreme-ultraviolet- and soft X-ray-regime which are suitable for single exposure applications as they are paramount for studying dynamics in nanoscale systems. We evaluate the performance of
currently available table-top sources, with special emphasis on applications, photon flux, and coherence. Examples for applications of single shot imaging in physics, biology, and industrial applications are discussed.

Capabilities of a SXRL at 32.8 nm by collisional ionization gating of krypton
gas at the Laboratoire d’Optique Appliquee (Paris) with a single shot CDI setup of a binary object. (I) Diffractogram of the object [the SEM image is shown in the inset (II)]. (II) The reconstructed amplitude of the object from Ref. 90.

Original link to the journal:
https://aca.scitation.org/doi/10.1063/1.5082686